Scanning electron microscopy

Author: Daviti Surmanidze
Keywords: microscope
Annotation:

Greek words micros, which means small, and skopeo, which means to look, are the roots of the English word microscope. A scanning electron microscope's primary purpose is to magnify and observe objects that are invisible to the human eye, just like any other type of microscope. A scanning electron microscope employs a high-energy electron beam to scan the surface of a sample, as opposed to a light microscope, which magnifies an object using a light beam. Because electrons have a shorter wavelength than optical light, they can detect a lot more features in a sample. An object can be magnified by a million or more orders of magnitude using a modern electron microscope. A detailed analysis of the X-rays that are produced when the research sample interacts with the electron cone can reveal information about its composition. Finding the material's composition, surface structure, crystallographic, physical, and chemical characteristics can be done with the aid of a scanning electron microscope. This instrument is widely used in both academic and industrial research fields due to its high resolution, wide range of samples that can be investigated, ability to perform microchemical analysis, short turnaround times for analysis and research, and low complexity. The scanning electron microscope has advanced tremendously over time, broadening its capabilities and potential uses. The resolution of samples was greatly enhanced by new technologies in the electron emission source and enhanced electro-optical detectors. Observing dynamic processes and conducting research under controlled conditions are made possible by modern scanning electron microscopes.